发明授权
- 专利标题: Low backscatter test method and apparatus
- 专利标题(中): 低背散射测试方法和装置
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申请号: US12432806申请日: 2009-04-30
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公开(公告)号: US07964834B2公开(公告)日: 2011-06-21
- 发明人: Jonathan L Weber
- 申请人: Jonathan L Weber
- 申请人地址: US NH Nashua
- 专利权人: BAE Systems Information and Electronic Systems Integration Inc.
- 当前专利权人: BAE Systems Information and Electronic Systems Integration Inc.
- 当前专利权人地址: US NH Nashua
- 代理机构: Vern Maine & Associates
- 主分类号: G01C21/02
- IPC分类号: G01C21/02
摘要:
A compact instrument enables placement of the instrument such that the image of the laser beam, as retro reflected and diffracted, forms outside the tracking field of view. The target source and beam camera can be located at the focus of a Cassegrain objective. Embodiments include shared objective and twin objective design. With a shared objective design, both the beam projector and profiling camera can see the same focal length. A two objective design can use two different focal lengths.
公开/授权文献
- US20100276569A1 LOW BACKSCATTER TEST METHOD AND APPARATUS 公开/授权日:2010-11-04
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