Invention Grant
- Patent Title: Resonance frequency determining method, resonance frequency selecting method, and resonance frequency determining apparatus
- Patent Title (中): 谐振频率确定方法，谐振频率选择方法和谐振频率确定装置
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Application No.: US11568300Application Date: 2005-04-26
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Publication No.: US07965850B2Publication Date: 2011-06-21
- Inventor: Daisuke Higashihara
- Applicant: Daisuke Higashihara
- Applicant Address: JP Kobe-shi
- Assignee: TOA Corporation
- Current Assignee: TOA Corporation
- Current Assignee Address: JP Kobe-shi
- Agency: Marshall, Gerstein & Borun LLP
- Priority: JP2004-131629 20040427
- International Application: PCT/JP2005/007868 WO 20050426
- International Announcement: WO2005/104610 WO 20051103
- Main IPC: H04R29/00
- IPC: H04R29/00 ; G01H13/00
Abstract:
A resonant frequency characteristic in a resonant space is detected, based on a base amplitude frequency characteristic obtained by outputting a sound wave of a specified measurement signal from a speaker 13 disposed in a sound space 40 and by receiving the sound wave in a microphone 14 disposed in the sound space 40, a first amplitude frequency characteristic obtained by outputting, from the speaker 13, a sound wave of the measurement signal and a signal output from the microphone 14 and by receiving the sound wave in the microphone 14, and a second amplitude frequency characteristic obtained by outputting, from the speaker 13, a sound wave of the measurement signal and a phase inverted signal obtain by inverting a phase of the signal output from the microphone 14 and by receiving the sound wave in the microphone 14.
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