发明授权
- 专利标题: System and method for testing LEDs on a motherboard
- 专利标题(中): 用于在主板上测试LED的系统和方法
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申请号: US11781966申请日: 2007-07-24
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公开(公告)号: US07965884B2公开(公告)日: 2011-06-21
- 发明人: Kuan-Lin Wu , Wei-Yuan Chen
- 申请人: Kuan-Lin Wu , Wei-Yuan Chen
- 申请人地址: TW Tu-Cheng, New Taipei
- 专利权人: Hon Hai Precision Industry Co., Ltd.
- 当前专利权人: Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址: TW Tu-Cheng, New Taipei
- 代理商 Frank R. Niranjan
- 优先权: TW95141731A 20061110
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
An exemplary method and system for testing light-emitting diodes (LEDs) uses a camera module to take two bulb images of transparent bulbs connected to each of the LEDs. A first bulb image is captured when the LEDs are set in a power-on state, and a second bulb image is captured when the LEDs are set in a power-off state. The method divides each of the two bulb images into small pictures, and calculates an average pixel value of each of the small pictures. After calculating a first difference of each of the small pictures between the average pixel value and a first predetermined value, and a second difference of each of the small pictures between the average pixel value and a second predetermined value, the method ascertains a present state of each of the LEDs by comparing the two differences.
公开/授权文献
- US20080112607A1 SYSTEM AND METHOD FOR TESTING LEDS ON A MOTHERBOARD 公开/授权日:2008-05-15
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