Invention Grant
- Patent Title: System and method for testing LEDs on a motherboard
- Patent Title (中): 用于在主板上测试LED的系统和方法
-
Application No.: US11781966Application Date: 2007-07-24
-
Publication No.: US07965884B2Publication Date: 2011-06-21
- Inventor: Kuan-Lin Wu , Wei-Yuan Chen
- Applicant: Kuan-Lin Wu , Wei-Yuan Chen
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agent Frank R. Niranjan
- Priority: TW95141731A 20061110
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An exemplary method and system for testing light-emitting diodes (LEDs) uses a camera module to take two bulb images of transparent bulbs connected to each of the LEDs. A first bulb image is captured when the LEDs are set in a power-on state, and a second bulb image is captured when the LEDs are set in a power-off state. The method divides each of the two bulb images into small pictures, and calculates an average pixel value of each of the small pictures. After calculating a first difference of each of the small pictures between the average pixel value and a first predetermined value, and a second difference of each of the small pictures between the average pixel value and a second predetermined value, the method ascertains a present state of each of the LEDs by comparing the two differences.
Public/Granted literature
- US20080112607A1 SYSTEM AND METHOD FOR TESTING LEDS ON A MOTHERBOARD Public/Granted day:2008-05-15
Information query