发明授权
- 专利标题: Multi-variable regression for metrology
- 专利标题(中): 计量学的多元回归
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申请号: US12103690申请日: 2008-04-15
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公开(公告)号: US07966142B2公开(公告)日: 2011-06-21
- 发明人: Wen Zhan Zhou , Zheng Zou , Jasper Goh , Mei Sheng Zhou
- 申请人: Wen Zhan Zhou , Zheng Zou , Jasper Goh , Mei Sheng Zhou
- 申请人地址: SG Singapore
- 专利权人: GLOBALFOUNDRIES Singapore Pte. Ltd.
- 当前专利权人: GLOBALFOUNDRIES Singapore Pte. Ltd.
- 当前专利权人地址: SG Singapore
- 代理机构: Horizon IP Pte. Ltd.
- 主分类号: G01D21/00
- IPC分类号: G01D21/00 ; G06F19/00
摘要:
A method for assessing metrology tool accuracy is described. Multi-variable regression is used to define the accuracy of a metrology tool such that the interaction between different measurement parameters is taken into account. A metrology tool under test (MTUT) and a reference metrology tool (RMT) are used to measure a set of test profiles. The MTUT measures the test profiles to generate a MTUT data set for a first measurement parameter. The RMT measures the test profiles to generate RMT data sets for the first measurement parameter, and at least a second measurement parameter. Multi-variable regression is then performed to generate a best-fit plane for the data sets. The coefficient of determination (R2 value) represents the accuracy index of the MTUT.
公开/授权文献
- US20090258445A1 MULTI-VARIABLE REGRESSION FOR METROLOGY 公开/授权日:2009-10-15
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