发明授权
- 专利标题: Fatigue test apparatus for thin element of electronic device
- 专利标题(中): 电子元件薄元件疲劳试验装置
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申请号: US12417764申请日: 2009-04-03
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公开(公告)号: US07966891B2公开(公告)日: 2011-06-28
- 发明人: Lei Li , Ping Chen , Zhi-Qiang Jiang , Chun-Ying Wang , Xue-Liang Zhai , Li-Ping Huang , Zhi Cheng , Chang-Fa Sun , Xian-Cui Du
- 申请人: Lei Li , Ping Chen , Zhi-Qiang Jiang , Chun-Ying Wang , Xue-Liang Zhai , Li-Ping Huang , Zhi Cheng , Chang-Fa Sun , Xian-Cui Du
- 申请人地址: CN Shenzhen, Guangdong Province HK Kowloon
- 专利权人: Shenzhen Futaigong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- 当前专利权人: Shenzhen Futaigong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- 当前专利权人地址: CN Shenzhen, Guangdong Province HK Kowloon
- 代理商 Steven M. Reiss
- 优先权: CN200810301248 20080422
- 主分类号: G01N3/20
- IPC分类号: G01N3/20
摘要:
A fatigue test apparatus for thin workpiece includes a supporting module, a driving mechanism, a first connecting module, a second connecting module, a first holding post, a second holding post and a computer system. The first and second connecting modules are respectively fixed to two sides of the supporting module. Ends of the first holding post and the second holding post are fixed to the first and second connecting modules. The computer system electronically connects with and controls the driving mechanism. The first holding post and the second holding post are drive to rotate by the driving mechanism.
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