发明授权
US07968256B2 Near field exposure mask, method of forming resist pattern using the mask, and method of producing device
失效
近场曝光掩模,使用掩模形成抗蚀剂图案的方法,以及制造装置的方法
- 专利标题: Near field exposure mask, method of forming resist pattern using the mask, and method of producing device
- 专利标题(中): 近场曝光掩模,使用掩模形成抗蚀剂图案的方法,以及制造装置的方法
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申请号: US12376426申请日: 2007-10-05
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公开(公告)号: US07968256B2公开(公告)日: 2011-06-28
- 发明人: Toshiki Ito , Natsuhiko Mizutani , Akira Terao
- 申请人: Toshiki Ito , Natsuhiko Mizutani , Akira Terao
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2006-276052 20061010
- 国际申请: PCT/JP2007/070015 WO 20071005
- 国际公布: WO2008/047733 WO 20080424
- 主分类号: G03F1/00
- IPC分类号: G03F1/00 ; G03F7/00
摘要:
Provided are a near field exposure mask which can suppress heat generation of a mask during exposure and can also suppress variation in size of a resist pattern for each shot, and a resist pattern forming method using the same. The near field exposure mask includes a transparent mask matrix l0; a light shielding layer l2 formed above the transparent mask matrix l0 and containing silicon; a reflective layer l1 formed between the transparent mask matrix l0 and the light shielding layer l2; and an opening pattern provided in the reflective layer l1 and the light shielding layer l2 and being less in size than an exposure wavelength λ (nm), wherein the reflectance at an interface between the transparent mask matrix l0 and the reflective layer l1 is higher than a reflectance at an interface between a transparent mask matrix and a light shielding layer formed on the transparent mask matrix and containing silicon of a near field exposure mask which has no reflective layer between the transparent mask matrix and the light shielding layer.
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