发明授权
US07969573B2 Method and system for obtaining n and k map for measuring fly-height
有权
用于获取测量飞行高度的n和k图的方法和系统
- 专利标题： Method and system for obtaining n and k map for measuring fly-height
- 专利标题（中）： 用于获取测量飞行高度的n和k图的方法和系统
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申请号： US12083064申请日： 2006-09-27
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公开(公告)号： US07969573B2公开(公告)日： 2011-06-28
- 发明人: Siang Huei Leong , Zhimin Yuan , Bo Liu
- 申请人： Siang Huei Leong , Zhimin Yuan , Bo Liu
- 申请人地址： SG Centros
- 专利权人： Agency for Science, Technology and Research
- 当前专利权人： Agency for Science, Technology and Research
- 当前专利权人地址： SG Centros
- 代理机构： Harness, Dickey & Pierce, P.L.C.
- 国际申请： PCT/SG2006/000283 WO 20060927
- 国际公布： WO2007/040462 WO 20070412
- 主分类号： G01J4/00
- IPC分类号： G01J4/00
摘要：
A method for obtaining a refractive index (n) and extinction coefficient (k) map of a slider surface, the method comprising the steps of processing an image of the slider surface to obtain spatially resolved normalized intensity data of the slider surface; measuring n and k values of the slider surface at different areas of the slider surface to obtain reflectivity data of the slider surface; mapping a distribution of the normalized intensity data to a distribution of the reflectivity data for deriving the n and k map of the slider surface.
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