Invention Grant
- Patent Title: X-ray analyzer and X-ray analysis method
- Patent Title (中): X射线分析仪和X射线分析法
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Application No.: US12544562Application Date: 2009-08-20
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Publication No.: US07970101B2Publication Date: 2011-06-28
- Inventor: Noriaki Sakai , Toshiyuki Takahara , Yoshiki Matoba
- Applicant: Noriaki Sakai , Toshiyuki Takahara , Yoshiki Matoba
- Applicant Address: JP
- Assignee: SII Nanotechnology Inc.
- Current Assignee: SII Nanotechnology Inc.
- Current Assignee Address: JP
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2008-214715 20080822; JP2008-277732 20081029
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01N23/203

Abstract:
An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included.
Public/Granted literature
- US20100046700A1 X-RAY ANALYZER AND X-RAY ANALYSIS METHOD Public/Granted day:2010-02-25
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