发明授权
- 专利标题: Methods and devices for high performance consistency check
- 专利标题(中): 用于高性能一致性检查的方法和设备
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申请号: US12186981申请日: 2008-08-06
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公开(公告)号: US07971092B2公开(公告)日: 2011-06-28
- 发明人: Kapil Sundrani
- 申请人: Kapil Sundrani
- 申请人地址: US CA Milpitas
- 专利权人: LSI Corporation
- 当前专利权人: LSI Corporation
- 当前专利权人地址: US CA Milpitas
- 代理机构: Duft Bornsen & Fishman LLP
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
Methods and devices for reading data from a plurality of storage devices belonging to a plurality of spans and checking consistency (e.g., XOR parity check) of data belonging to each span independently of another span in one embodiment. Methods and devices for reading data from a plurality of stripes and checking consistency of the data from the plurality of stripes in another embodiment.
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