发明授权
US07971120B2 Method and apparatus for covering a multilayer process space during at-speed testing
有权
在高速测试期间覆盖多层工艺空间的方法和装置
- 专利标题: Method and apparatus for covering a multilayer process space during at-speed testing
- 专利标题(中): 在高速测试期间覆盖多层工艺空间的方法和装置
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申请号: US12340072申请日: 2008-12-19
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公开(公告)号: US07971120B2公开(公告)日: 2011-06-28
- 发明人: Yiyu Shi , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
- 申请人: Yiyu Shi , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
In one embodiment, the invention is a method and apparatus covering a multilayer process space during at-speed testing. One embodiment of a method for selecting a set of paths with which to test a process space includes determining a number N of paths to be included in the set of paths such that at least number M of paths in N for which testing of the process space will fail, computing a metric that substantially ensures that the set of paths satisfies the requirements of N and M, and outputting the metric for use in selecting the set of paths.
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