发明授权
US07971120B2 Method and apparatus for covering a multilayer process space during at-speed testing 有权
在高速测试期间覆盖多层工艺空间的方法和装置

Method and apparatus for covering a multilayer process space during at-speed testing
摘要:
In one embodiment, the invention is a method and apparatus covering a multilayer process space during at-speed testing. One embodiment of a method for selecting a set of paths with which to test a process space includes determining a number N of paths to be included in the set of paths such that at least number M of paths in N for which testing of the process space will fail, computing a metric that substantially ensures that the set of paths satisfies the requirements of N and M, and outputting the metric for use in selecting the set of paths.
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