发明授权
- 专利标题: Electrical connector for test socket
- 专利标题(中): 用于测试插座的电气连接器
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申请号: US12547500申请日: 2009-08-26
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公开(公告)号: US07972159B2公开(公告)日: 2011-07-05
- 发明人: Ming-Yue Chen , Shih-Wei Hsiao , Ke-Hao Chen , Wen-Yi Hsieh
- 申请人: Ming-Yue Chen , Shih-Wei Hsiao , Ke-Hao Chen , Wen-Yi Hsieh
- 申请人地址: TW New Taipei
- 专利权人: Hon Hai Precision Ind. Co., Ltd.
- 当前专利权人: Hon Hai Precision Ind. Co., Ltd.
- 当前专利权人地址: TW New Taipei
- 代理商 Andrew C. Cheng; Wei Te Chung; Ming Chieh Chang
- 优先权: TW097132449 20080826; TW097133393 20080901
- 主分类号: H01R11/22
- IPC分类号: H01R11/22
摘要:
An electrical connector (100) for electrically connecting a Central Processing Unit (CPU) with a Printed Circuit Board (PCB), includes a base (2), a plurality of insulative layers (34), a plurality of contacts (4) and a plurality of cams (33). The base defines a cavity (21) and the insulative layers are stacked and received in the cavity. The insulative layers define a plurality of passageways therein. The contacts are received in the passageways of the insulative layers. The cams are rotatable around to push different insulative layers to have different degrees of movement in a predetermined direction.
公开/授权文献
- US20100055936A1 ELECTRICAL CONNECTOR FOR TEST SOCKET 公开/授权日:2010-03-04
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