发明授权
- 专利标题: Through-substrate via for semiconductor device
- 专利标题(中): 用于半导体器件的通孔基板通孔
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申请号: US11844650申请日: 2007-08-24
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公开(公告)号: US07973413B2公开(公告)日: 2011-07-05
- 发明人: Chen-Cheng Kuo , Chen Chen-Shien , Kai-Ming Ching , Chih-Hua Chen
- 申请人: Chen-Cheng Kuo , Chen Chen-Shien , Kai-Ming Ching , Chih-Hua Chen
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: H01L23/52
- IPC分类号: H01L23/52
摘要:
A semiconductor device including a substrate having a front surface and a back surface is provided. A plurality of interconnect layers are formed on the front surface and have a first surface opposite the front surface of the substrate. A tapered profile via extends from the first surface of the plurality of interconnect layers to the back surface of the substrate. In one embodiment, a insulating layer is formed on the substrate and includes an opening, and wherein the opening includes conductive material providing contact to the tapered profile via.
公开/授权文献
- US20090051039A1 THROUGH-SUBSTRATE VIA FOR SEMICONDUCTOR DEVICE 公开/授权日:2009-02-26
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