Invention Grant
- Patent Title: Measurement apparatus, test apparatus and measurement method
- Patent Title (中): 测量装置，试验装置及测量方法
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Application No.: US12171296Application Date: 2008-07-11
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Publication No.: US07973543B2Publication Date: 2011-07-05
- Inventor: Hiroki Andoh , Kunihiro Matsuura , Satoshi Kodera
- Applicant: Hiroki Andoh , Kunihiro Matsuura , Satoshi Kodera
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Main IPC: G01R27/08
- IPC: G01R27/08 ; G01R31/26
Abstract:
Provided is a measurement apparatus that measures a current flowing through a load, including a power supply section that outputs a current supplied to the load; a current measuring section that measures a load current flowing between the load and the power supply section; a switch that is connected in parallel with the current measuring section between the load and the power supply section; and a control section that disconnects the switch during measurement of the load current and connects the switch when the load current falls outside of a predetermined reference range.
Public/Granted literature
- US20100007327A1 MEASUREMENT APPARATUS, TEST APPARATUS AND MEASUREMENT METHOD Public/Granted day:2010-01-14
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