Invention Grant
- Patent Title: Systems and methods for dibit correction
- Patent Title (中): 双向校正的系统和方法
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Application No.: US12463626Application Date: 2009-05-11
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Publication No.: US07974030B2Publication Date: 2011-07-05
- Inventor: George Mathew , Hongwei Song , Yuan Xing Lee
- Applicant: George Mathew , Hongwei Song , Yuan Xing Lee
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Hamilton DeSanctis & Cha
- Main IPC: G11B20/10
- IPC: G11B20/10

Abstract:
Various embodiments of the present invention provide systems and methods for providing a corrected dibit signal. As an example, various embodiments of the present invention provide dibit correction circuits. Such dibit correction circuits include a dibit sample buffer, a maximum sample detector circuit, a side sample detector circuit, and a dibit correction circuit. The dibit sample buffer includes a plurality of samples of an uncorrected dibit signal. The maximum sample detector circuit identifies a maximum sample of the plurality of samples of the uncorrected dibit signal, and the side sample detector circuit identifies a first side sample prior to the maximum sample on the uncorrected dibit signal and a second side sample following the maximum sample on the uncorrected dibit signal. The dibit correction circuit applies a correction factor calculated based at least in part on the maximum sample, the first side sample and the second side sample to at least a subset of the plurality of samples of the uncorrected dibit signals to yield a plurality of corrected dibit signals.
Public/Granted literature
- US20100157458A1 Systems and Methods for Dibit Correction Public/Granted day:2010-06-24
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