发明授权
US07981744B2 Field-effect transistor, semiconductor device, a method for manufacturing them, and a method of semiconductor crystal growth
有权
场效应晶体管,半导体器件,它们的制造方法以及半导体晶体生长方法
- 专利标题: Field-effect transistor, semiconductor device, a method for manufacturing them, and a method of semiconductor crystal growth
- 专利标题(中): 场效应晶体管,半导体器件,它们的制造方法以及半导体晶体生长方法
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申请号: US11578965申请日: 2005-06-09
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公开(公告)号: US07981744B2公开(公告)日: 2011-07-19
- 发明人: Masayoshi Kosaki , Koji Hirata , Masanobu Senda , Naoki Shibata
- 申请人: Masayoshi Kosaki , Koji Hirata , Masanobu Senda , Naoki Shibata
- 申请人地址: JP Aichi-ken
- 专利权人: Toyoda Gosei Co., Ltd.
- 当前专利权人: Toyoda Gosei Co., Ltd.
- 当前专利权人地址: JP Aichi-ken
- 代理机构: McGinn IP Law Group, PLLC
- 优先权: JP2004-172495 20040610; JP2004-176675 20040615; JP2004-176676 20040615
- 国际申请: PCT/JP2005/011006 WO 20050609
- 国际公布: WO2005/122234 WO 20051222
- 主分类号: H01L21/336
- IPC分类号: H01L21/336 ; H01L21/3205
摘要:
A field-effect transistor which comprises a buffer layer and a barrier layer each of which is made of a Group III nitride compound semiconductor and has a channel at the interface inside of the buffer layer to the barrier layer, wherein the barrier layer has multiple-layer structure comprising an abruct interface providing layer which composes the lowest semiconductor layer in said barrier layer and whose composition varies rapidly at the interface of said buffer layer, and an electrode connection plane providing layer which constructs the uppermost semiconductor layer and whose upper surface is formed flat.
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