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US07983097B2 Wordline driving circuit of semiconductor memory device 失效
半导体存储器件的字线驱动电路

Wordline driving circuit of semiconductor memory device
摘要:
Wordline driving circuit of semiconductor memory device includes a bias generator configured to generate a threshold bias voltage for accessing data, an over-driver configured to increase the threshold bias voltage at an initial stage of a data accessing operation and a wordline driver configured to activate a wordline in response to the threshold bias voltage and a signal output from the over-driver.
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