Certain embodiments provide a radiation analysis system for material segmentation utilizing computed tomography (CT) scans. The radiation analysis system includes an input module configured to input dual energy data. The dual energy scanned data includes first data corresponding to a first parameter and second data corresponding to a second parameter for a given scanned volume. The radiation analysis system also includes a processor configured to generate a scatter plot based on the dual energy data. The first data corresponds to a first axis and the second data corresponds to a second axis. The processor is configured to identify at least one material type based on the scatter plot.