发明授权
- 专利标题: Pattern recognition system, pattern recognition method, and pattern recognition program
- 专利标题(中): 模式识别系统,模式识别方法和模式识别程序
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申请号: US12831711申请日: 2010-07-07
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公开(公告)号: US07983484B2公开(公告)日: 2011-07-19
- 发明人: Lei Huang
- 申请人: Lei Huang
- 申请人地址: JP Tokyo
- 专利权人: NEC Corporation
- 当前专利权人: NEC Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Foley & Lardner LLP
- 优先权: JP2004-008533 20040115
- 主分类号: G06K9/46
- IPC分类号: G06K9/46 ; G06K9/72
摘要:
A pattern recognition system, pattern recognition method, and pattern recognition program capable of increasing the accuracy in computing the false acceptance probability and capable of ensuring a stable security strength are provided. Pattern recognition systems 10 and 10a comprise a first probability computation unit 32, and a second probability computation unit 33 coupled to the first probability computation unit 32. The first probability computation unit 32 computes a first probability PFCR based on the number n of corresponding characteristic points cs1 to csn and cf1 to cfn indicating points corresponding between characteristic points s1 to sns in a first pattern and characteristic points f1 to fnf in a second pattern. The first probability PFCR indicates the probability of existence of a third pattern that has a greater number of corresponding characteristic points to the first pattern than the number n of the corresponding characteristic points. The second probability computation unit 33 refers to the first probability PFCR to compute a false acceptance probability PFAR indicating the probability of falsely determining that the first pattern and the second pattern correspond to each other.
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