Invention Grant
US07983484B2 Pattern recognition system, pattern recognition method, and pattern recognition program 有权
模式识别系统,模式识别方法和模式识别程序

  • Patent Title: Pattern recognition system, pattern recognition method, and pattern recognition program
  • Patent Title (中): 模式识别系统,模式识别方法和模式识别程序
  • Application No.: US12831711
    Application Date: 2010-07-07
  • Publication No.: US07983484B2
    Publication Date: 2011-07-19
  • Inventor: Lei Huang
  • Applicant: Lei Huang
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Foley & Lardner LLP
  • Priority: JP2004-008533 20040115
  • Main IPC: G06K9/46
  • IPC: G06K9/46 G06K9/72
Pattern recognition system, pattern recognition method, and pattern recognition program
Abstract:
A pattern recognition system, pattern recognition method, and pattern recognition program capable of increasing the accuracy in computing the false acceptance probability and capable of ensuring a stable security strength are provided. Pattern recognition systems 10 and 10a comprise a first probability computation unit 32, and a second probability computation unit 33 coupled to the first probability computation unit 32. The first probability computation unit 32 computes a first probability PFCR based on the number n of corresponding characteristic points cs1 to csn and cf1 to cfn indicating points corresponding between characteristic points s1 to sns in a first pattern and characteristic points f1 to fnf in a second pattern. The first probability PFCR indicates the probability of existence of a third pattern that has a greater number of corresponding characteristic points to the first pattern than the number n of the corresponding characteristic points. The second probability computation unit 33 refers to the first probability PFCR to compute a false acceptance probability PFAR indicating the probability of falsely determining that the first pattern and the second pattern correspond to each other.
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