Invention Grant
- Patent Title: Panel inspection apparatus and inspection method
- Patent Title (中): 面板检查装置及检验方法
-
Application No.: US12262537Application Date: 2008-10-31
-
Publication No.: US07984649B2Publication Date: 2011-07-26
- Inventor: Ichiro Kono , Kenzo Takeda , Shin Yoshida
- Applicant: Ichiro Kono , Kenzo Takeda , Shin Yoshida
- Applicant Address: JP Tokyo
- Assignee: Honda Motor Co., Ltd.
- Current Assignee: Honda Motor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2007-284919 20071101
- Main IPC: G01N29/12
- IPC: G01N29/12

Abstract:
A panel inspection apparatus includes a resonant frequency extracting unit for extracting a plurality of resonant frequencies of a panel, a resonant frequency selecting unit for selecting a combination of resonant frequencies consisting of two resonant frequencies A and B with different vibration propagation paths among the extracted plurality of resonant frequencies, a non-defective range generating unit for generating a non-defective range on a coordinate system in which resonant frequencies A and B are taken on coordinate axes by statistically processing a set of the resonant frequencies A and B selected for each of a plurality of non-defective panels determined as non-defective in advance, and a panel quality determining unit for determining whether the quality of the panel to be inspected is good based on comparison between resonant frequencies A and B selected for the panel to be inspected and the non-defective range generated by the non-defective range generating unit.
Public/Granted literature
- US20090114018A1 PANEL INSPECTION APPARATUS AND INSPECTION METHOD Public/Granted day:2009-05-07
Information query