发明授权
- 专利标题: Method of manufacturing silicon nanowires using silicon nanodot thin film
- 专利标题(中): 使用硅纳米点薄膜制造硅纳米线的方法
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申请号: US12304737申请日: 2006-12-08
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公开(公告)号: US07985666B2公开(公告)日: 2011-07-26
- 发明人: Rae-Man Park , Sang-Hyeob Kim , Jonghyurk Park , Sunglyul Maeng
- 申请人: Rae-Man Park , Sang-Hyeob Kim , Jonghyurk Park , Sunglyul Maeng
- 申请人地址: KR Daejeon
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR Daejeon
- 代理机构: Rabin & Berdo, PC
- 优先权: KR10-2006-0053896 20060615
- 国际申请: PCT/KR2006/005309 WO 20061208
- 国际公布: WO2007/145407 WO 20071221
- 主分类号: H01L21/20
- IPC分类号: H01L21/20 ; H01L21/36
摘要:
Provided is a method of manufacturing silicon nanowires including: forming a silicon nanodot thin film having a plurality of silicon nanodots exposed on a substrate; and growing the silicon nanowires on the silicon nanodot thin film using the silicon nanodots as a nucleation site. The silicon nanowires can be manufactured using the silicon nanodot thin film disposed in a silicon nitride matrix, as a nucleation site instead of using catalytic metal islands, wherein the silicon nanodot thin film includes the silicon nanodots.
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