发明授权
US07985952B2 Charged particle spin polarimeter, microscope, and photoelectron spectroscope 有权
带电粒子自旋旋光仪,显微镜和光电子分光镜

  • 专利标题: Charged particle spin polarimeter, microscope, and photoelectron spectroscope
  • 专利标题(中): 带电粒子自旋旋光仪,显微镜和光电子分光镜
  • 申请号: US12028996
    申请日: 2008-02-11
  • 公开(公告)号: US07985952B2
    公开(公告)日: 2011-07-26
  • 发明人: Teruo Kohashi
  • 申请人: Teruo Kohashi
  • 申请人地址: JP Tokyo
  • 专利权人: Hitachi, Ltd.
  • 当前专利权人: Hitachi, Ltd.
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Mattingly & Malur, PC
  • 优先权: JP2007-053614 20070305; JP2008-002093 20080109
  • 主分类号: G01N23/00
  • IPC分类号: G01N23/00
Charged particle spin polarimeter, microscope, and photoelectron spectroscope
摘要:
A charged particle spin polarimeter that is capable of resolving with high efficiency the magnetic moment of a charged particle. The charged particle spin polarimeter has a pair of convex and concave magnetic poles to apply a magnetic field with gradient to an incident charged particle and a pair of plain plate electrodes to apply, to a charged particle, an electric field for canceling a Lorentz force that the charged particle receives from the magnetic field. The magnetic moment in the magnetic field direction of a charged particle is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle.
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