发明授权
US07985952B2 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
有权
带电粒子自旋旋光仪,显微镜和光电子分光镜
- 专利标题: Charged particle spin polarimeter, microscope, and photoelectron spectroscope
- 专利标题(中): 带电粒子自旋旋光仪,显微镜和光电子分光镜
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申请号: US12028996申请日: 2008-02-11
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公开(公告)号: US07985952B2公开(公告)日: 2011-07-26
- 发明人: Teruo Kohashi
- 申请人: Teruo Kohashi
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2007-053614 20070305; JP2008-002093 20080109
- 主分类号: G01N23/00
- IPC分类号: G01N23/00
摘要:
A charged particle spin polarimeter that is capable of resolving with high efficiency the magnetic moment of a charged particle. The charged particle spin polarimeter has a pair of convex and concave magnetic poles to apply a magnetic field with gradient to an incident charged particle and a pair of plain plate electrodes to apply, to a charged particle, an electric field for canceling a Lorentz force that the charged particle receives from the magnetic field. The magnetic moment in the magnetic field direction of a charged particle is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle.
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