发明授权
- 专利标题: Ultra high resolution timing measurement
- 专利标题(中): 超高分辨率时序测量
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申请号: US12757396申请日: 2010-04-09
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公开(公告)号: US07986591B2公开(公告)日: 2011-07-26
- 发明人: Nan-Hsin Tseng , Chin-Chou Liu , Saurabh Gupta
- 申请人: Nan-Hsin Tseng , Chin-Chou Liu , Saurabh Gupta
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman Ham & Berner, LLP
- 主分类号: G04F8/00
- IPC分类号: G04F8/00 ; G01R13/02
摘要:
An integrated circuit for high-resolution timing measurement includes a delay pulse generator, the first oscillator to generate the first clock with the first frequency, the second oscillator to generate the second clock with the second frequency, an oscillator tuner, a sampling module, a counter, wherein the delay pulse generator generated a delayed pulse from the second clock, the oscillator tuner controls the second frequency to be as close as possible to the first frequency without being the same as the second frequency, the sampling module samples the delayed pulse at the first frequency, the counter generates a digital counter value by counting a number of sampling by the sampling module, and a time width of the delayed pulse can be calculated by the digital counter value. The second oscillator can be a tunable ring oscillator with one or more coarse tune stages and one or more fine-tune stages.
公开/授权文献
- US20110038451A1 ULTRA HIGH RESOLUTION TIMING MEASUREMENT 公开/授权日:2011-02-17
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