发明授权
- 专利标题: Resistance random access memory
- 专利标题(中): 电阻随机存取存储器
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申请号: US11656246申请日: 2007-01-18
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公开(公告)号: US07989790B2公开(公告)日: 2011-08-02
- 发明人: Erh-Kun Lai , Chiahua Ho , Kuang-Yeu Hsieh
- 申请人: Erh-Kun Lai , Chiahua Ho , Kuang-Yeu Hsieh
- 申请人地址: TW Hsinchu
- 专利权人: MACRONIX International Co., Ltd.
- 当前专利权人: MACRONIX International Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Jianq Chyun IP Office
- 主分类号: H01L47/00
- IPC分类号: H01L47/00
摘要:
A memory comprises a number of word lines in a first direction, a number of bit lines in a second direction, each coupled to at least one of the word lines, and a number of memory elements, each coupled to one of the word lines and one of the bit lines. Each memory element comprises a top electrode for connecting to a corresponding word line, a bottom electrode for connecting to a corresponding bit line, a resistive layer on the bottom electrode, and at least two separate liners, each liner having resistive materials on both ends of the liner and each liner coupled between the top electrode and the resistive layer.
公开/授权文献
- US20080173982A1 Resistance random access memory 公开/授权日:2008-07-24
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