Invention Grant
- Patent Title: Processor temperature measurement through median sampling
- Patent Title (中): 处理器温度测量通过中值采样
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Application No.: US11557405Application Date: 2006-11-07
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Publication No.: US07991514B2Publication Date: 2011-08-02
- Inventor: Alan D. Berenbaum , Richard E. Wahler , Eileen M. Marando
- Applicant: Alan D. Berenbaum , Richard E. Wahler , Eileen M. Marando
- Applicant Address: US NY Hauppauge
- Assignee: Standard Microsystems Corporation
- Current Assignee: Standard Microsystems Corporation
- Current Assignee Address: US NY Hauppauge
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood
- Main IPC: G05D23/00
- IPC: G05D23/00

Abstract:
Temperature readings obtained within a computer system from the location of monitored circuit elements may be oversampled at least three times, and a median average of the three parameter readings rather than the arithmetic mean may be used for controlling a device, e.g. a fan, configured to regulate the environmental parameter, e.g. temperature, a the location of the monitored circuit elements. For example, when a CPU temperature reading is requested by the system comprising the CPU, a thermal monitoring system may acquire at least three consecutive temperature readings of the CPU, discard the highest temperature reading and the lowest temperature reading, and return the median reading to be used in controlling a fan configured to regulate temperature at the location of the CPU, resulting in more accurate temperature readings and more accurate fan control. In various implementations, more than three readings may be considered at a time, and running averages based on median values may be computed in a variety of ways to obtain a temperature control value to control the fan.
Public/Granted literature
- US20080125915A1 Processor Temperature Measurement Through Median Sampling Public/Granted day:2008-05-29
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