Invention Grant
- Patent Title: Total structural risk model
- Patent Title (中): 总结构风险模型
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Application No.: US12938247Application Date: 2010-11-02
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Publication No.: US07991690B2Publication Date: 2011-08-02
- Inventor: Tirthankar Choudhuri , Anjali Dewan , Amber Gupta , Kathleen Haggerty , Di Xu , Chao Yuan
- Applicant: Tirthankar Choudhuri , Anjali Dewan , Amber Gupta , Kathleen Haggerty , Di Xu , Chao Yuan
- Applicant Address: US NY New York
- Assignee: American Express Travel Related Services Company, Inc.
- Current Assignee: American Express Travel Related Services Company, Inc.
- Current Assignee Address: US NY New York
- Agency: Snell & Wilmer L.L.P.
- Main IPC: G06Q40/00
- IPC: G06Q40/00
Abstract:
The present invention generally relates to financial data processing, and in particular it relates to credit scoring, consumer profiling, consumer behavior analysis and modeling. More specifically, it relates to risk modeling using the inputs of credit bureau data, size of wallet data, and, optionally, internal data.
Public/Granted literature
- US20110047071A1 TOTAL STRUCTURAL RISK MODEL Public/Granted day:2011-02-24
Information query
