发明授权
- 专利标题： Peripheral device, integrated circuit for peripheral device and method for analyzing failure of peripheral device
- 专利标题（中）： 外围设备，外围设备集成电路及外围设备故障分析方法
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申请号： US12376257申请日： 2007-08-03
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公开(公告)号： US07992041B2公开(公告)日： 2011-08-02
- 发明人: Kazushi Yamamoto
- 申请人： Kazushi Yamamoto
- 申请人地址： JP Osaka
- 专利权人： Panasonic Corporation
- 当前专利权人： Panasonic Corporation
- 当前专利权人地址： JP Osaka
- 代理机构： Wenderoth, Lind & Ponack, L.L.P.
- 优先权： JP2006-212487 20060803
- 国际申请： PCT/JP2007/065245 WO 20070803
- 国际公布： WO2008/016136 WO 20080207
- 主分类号： G06F11/00
- IPC分类号： G06F11/00
摘要：
The peripheral device through an interface cable, and includes a second memory device for storing an evaluation program for evaluating the peripheral device and its integrated circuit. A detection section detects whether the mode indicating signal which is transmitted from the computer indicates a test mode or a normal mode, and a starting means starts the evaluation program on the second memory device when the detection section detects that the mode indicates signal a test mode.
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