Invention Grant
US07992046B2 Test system with simulation control device for testing functions of electronic devices
失效
具有仿真控制装置的测试系统，用于电子设备的测试功能
- Patent Title: Test system with simulation control device for testing functions of electronic devices
- Patent Title (中): 具有仿真控制装置的测试系统，用于电子设备的测试功能
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Application No.: US12329617Application Date: 2008-12-07
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Publication No.: US07992046B2Publication Date: 2011-08-02
- Inventor: Su-Kuang Yang , Chien-Hung Lo , Min-Fu Deng , Zheng-Quan Peng , Xiang Cao
- Applicant: Su-Kuang Yang , Chien-Hung Lo , Min-Fu Deng , Zheng-Quan Peng , Xiang Cao
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Agent Zhigang Ma
- Priority: CN200810302864 20080721
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/26
Abstract:
A test system for testing various functions of electronic devices includes a master device and a simulation control device. The master device is connected to an input device and the electronic devices through the simulation control device. The master device records input signals of the input device and generate simulation signals according to the input signals. The simulation control device simulates the input signals of the input device according to the simulation signals to test the electronic devices.
Public/Granted literature
- US20100017658A1 TEST SYSTEM AND METHOD WITH A SIMULATOR Public/Granted day:2010-01-21
Information query
