发明授权
- 专利标题: Transfer mechanism for target object to be inspected
- 专利标题(中): 要检查的目标物体的转移机制
-
申请号: US12492676申请日: 2009-06-26
-
公开(公告)号: US07994809B2公开(公告)日: 2011-08-09
- 发明人: Yutaka Akaike , Hiroshi Yamada , Tomoya Endo
- 申请人: Yutaka Akaike , Hiroshi Yamada , Tomoya Endo
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2008-172577 20080701
- 主分类号: G01R31/20
- IPC分类号: G01R31/20 ; G01R31/00
摘要:
A transfer mechanism for a target object includes at least two insulating wire materials disposed spaced from each other to transverse a mounting table, at least two pairs of supporting bodies horizontally disposed at outsides of the mounting table, for stretching said at least two wire materials in parallel with a mounting surface of the mounting table, and at least two grooves formed on the mounting surface of the mounting table to respectively receive therein said at least two wire materials by said at least two pairs of supporting bodies. The transfer mechanism further includes a first elevation driving mechanism for vertically moving said wire materials between said grooves and above of the mounting surface through said pairs of supporting bodies, wherein the target object is transferred between a carrying mechanism and the mounting table through said at least two wire materials.
公开/授权文献
- US20100001751A1 TRANSFER MECHANISM FOR TARGET OBJECT TO BE INSPECTED 公开/授权日:2010-01-07
信息查询