A flip-flop circuit having a scan function includes an internal clock generator to receive a clock signal, a scan enable signal, and a first input signal, and to output an internal timing signal based on each of the clock signal, the scan enable signal, and the first input signal. The circuit includes a dynamic input unit to receive a second input signal, the scan enable signal, a first timing signal, and the internal timing signal, and to output a first output signal. The circuit also includes a static output unit to receive the first timing signal and the first output signal and to output a static output signal, and the dynamic input unit outputs the first output signal corresponding to one of the first input signal and the second input signal, respectively, based on a status of the scan enable signal.