发明授权
US07996404B2 System and method for detecting and analyzing pattern relationships
有权
用于检测和分析模式关系的系统和方法
- 专利标题: System and method for detecting and analyzing pattern relationships
- 专利标题(中): 用于检测和分析模式关系的系统和方法
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申请号: US12320538申请日: 2009-01-28
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公开(公告)号: US07996404B2公开(公告)日: 2011-08-09
- 发明人: Andrew Wong , Chung Lam Li
- 申请人: Andrew Wong , Chung Lam Li
- 申请人地址: CA Waterloo
- 专利权人: Pattern Discovery Technologies Inc.
- 当前专利权人: Pattern Discovery Technologies Inc.
- 当前专利权人地址: CA Waterloo
- 代理机构: Gowling Lafleur Henderson LLP
- 代理商 Grant Tisdall
- 主分类号: G06F17/30
- IPC分类号: G06F17/30
摘要:
In its broad aspect, the invention provides a method for analyzing relationships among patterns within a data set having a set of samples and associated attribute values defining each attribute of each said sample. The method comprises receiving at an input at least two patterns; defining a data cluster within the data set for each of said at least two patterns, each defined data cluster having samples with attribute values associated with a corresponding pattern of said at least two patterns; grouping at least some of the samples of each defined data cluster with one another to generate a resultant data cluster; and calculating a variation between the attribute values of a first set of samples and the attribute values of a second set of samples within said resultant data cluster, the attribute values of the first set of samples and the second set of samples corresponding to the same attribute.
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