发明授权
US07996795B2 Method and apparatus for performing stress modeling of integrated circuit material undergoing material conversion 有权
用于进行材料转换的集成电路材料的应力模拟的方法和装置

  • 专利标题: Method and apparatus for performing stress modeling of integrated circuit material undergoing material conversion
  • 专利标题(中): 用于进行材料转换的集成电路材料的应力模拟的方法和装置
  • 申请号: US12429900
    申请日: 2009-04-24
  • 公开(公告)号: US07996795B2
    公开(公告)日: 2011-08-09
  • 发明人: Victor MorozXiaopeng Xu
  • 申请人: Victor MorozXiaopeng Xu
  • 申请人地址: US CA Mountain View
  • 专利权人: Synopsys, Inc.
  • 当前专利权人: Synopsys, Inc.
  • 当前专利权人地址: US CA Mountain View
  • 代理机构: Haynes Beffel & Wolfeld LLP
  • 代理商 Kenta Suzue
  • 主分类号: G06F17/50
  • IPC分类号: G06F17/50
Method and apparatus for performing stress modeling of integrated circuit material undergoing material conversion
摘要:
A method, a computer medium storing computer instructions performing a method, and a computer with processor and memory perform stress modeling as follows. The stress model transforms a representation of a material conversion of a first material in the integrated circuit to a second material in the integrated circuit. Prior to the material conversion the first material occupies a first space having a first boundary. After the material conversion the first material and the second material together occupy a second space having a second boundary. The first space and the second space are different. The stress model performed by the computer system transforms the representation of the material conversion of the first material to the second material into: i) the first material occupying the first space having the first boundary, and ii) a strain displacement condition of the first material. The strain displacement condition is determined by a spatial change from the first boundary to the second boundary.
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