发明授权
- 专利标题: Memory cell structure and method for fabrication thereof
- 专利标题(中): 存储单元结构及其制造方法
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申请号: US12361521申请日: 2009-01-28
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公开(公告)号: US07999300B2公开(公告)日: 2011-08-16
- 发明人: Zhao Lun , James Yong Meng Lee , Lee Wee Teo , Shyue Seng Tan , Chung Woh Lai , Johnny Widodo , Shailendra Mishra , Jeffrey Chee
- 申请人: Zhao Lun , James Yong Meng Lee , Lee Wee Teo , Shyue Seng Tan , Chung Woh Lai , Johnny Widodo , Shailendra Mishra , Jeffrey Chee
- 申请人地址: SG Singapore
- 专利权人: GLOBALFOUNDRIES Singapore Pte. Ltd.
- 当前专利权人: GLOBALFOUNDRIES Singapore Pte. Ltd.
- 当前专利权人地址: SG Singapore
- 代理机构: Horizon IP Pte Ltd
- 主分类号: H01L27/108
- IPC分类号: H01L27/108
摘要:
A memory cell includes a substrate, an access transistor and a storage capacitor. The access transistor comprising a gate stack disposed on the substrate, and a first and second diffusion region located on a first and second opposing sides of the gate stack. The storage capacitor comprises a first capacitor plate comprising a portion embedded within the substrate below the first diffusion region, a second capacitor plate and a capacitor dielectric sandwiched between the embedded portion of the first capacitor plate. At least a portion of the first diffusion region forms the second capacitor plate.
公开/授权文献
- US20100187587A1 MEMORY CELL STRUCTURE AND METHOD FOR FABRICATION THEREOF 公开/授权日:2010-07-29
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