Invention Grant
- Patent Title: Method for producing a semiconductor component
- Patent Title (中): 半导体部件的制造方法
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Application No.: US12145808Application Date: 2008-06-25
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Publication No.: US08003456B2Publication Date: 2011-08-23
- Inventor: Davide Chiola , Carsten Schaeffer
- Applicant: Davide Chiola , Carsten Schaeffer
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Dickstein Shapiro LLP
- Priority: DE102007029121 20070625
- Main IPC: H01L21/8238
- IPC: H01L21/8238

Abstract:
A method for producing a semiconductor component is proposed. The method includes providing a semiconductor body having a first surface; forming a mask on the first surface, wherein the mask has openings for defining respective positions of trenches; producing the trenches in the semiconductor body using the mask, wherein mesa structures remain between adjacent trenches; introducing a first dopant of a first conduction type using the mask into the bottoms of the trenches; carrying out a first thermal step; introducing a second dopant of a second conduction type, which is complementary to the first conduction type, at least into the bottoms of the trenches; and carrying out a second thermal step.
Public/Granted literature
- US20080315363A1 METHOD FOR PRODUCING A SEMICONDUCTOR COMPONENT, AND A SEMICONDUCTOR COMPONENT Public/Granted day:2008-12-25
Information query
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