发明授权
- 专利标题: Screening of silicon wafers used in photovoltaics
- 专利标题(中): 用于光伏电池的硅晶片的筛选
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申请号: US11722981申请日: 2006-07-28
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公开(公告)号: US08006566B2公开(公告)日: 2011-08-30
- 发明人: Bhushan L. Sopori , Peter Sheldon
- 申请人: Bhushan L. Sopori , Peter Sheldon
- 申请人地址: US CO Golden
- 专利权人: Alliance for Sustainable Energy, LLC
- 当前专利权人: Alliance for Sustainable Energy, LLC
- 当前专利权人地址: US CO Golden
- 代理商 Paul J. White; Cynthia S. Mitchell; John C. Stolpa
- 国际申请: PCT/US2006/029765 WO 20060728
- 国际公布: WO2008/013547 WO 20080131
- 主分类号: G01L1/24
- IPC分类号: G01L1/24
摘要:
A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.
公开/授权文献
- US20100136715A1 Screening of Silicon Wafers Used in Photovoltaics 公开/授权日:2010-06-03
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