发明授权
- 专利标题： Apparatus of measuring the orientation relationship between neighboring grains using a goniometer in a transmission electron microscope and method for revealing the characteristics of grain boundaries
- 专利标题（中）： 在透射电子显微镜中使用测角仪测量相邻晶粒之间的取向关系的装置以及揭示晶界特征的方法
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申请号： US12343853申请日： 2008-12-24
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公开(公告)号： US08008621B2公开(公告)日： 2011-08-30
- 发明人: Hi Won Jeong , Seong Moon Seo , Hyun Uk Hong , Young Soo Yoo , In Soo Kim , Baig Gyu Choi , Chang Yong Jo
- 申请人： Hi Won Jeong , Seong Moon Seo , Hyun Uk Hong , Young Soo Yoo , In Soo Kim , Baig Gyu Choi , Chang Yong Jo
- 申请人地址： KR Kyunsangnam-Do
- 专利权人： Korea Institute of Machinery & Materials
- 当前专利权人： Korea Institute of Machinery & Materials
- 当前专利权人地址： KR Kyunsangnam-Do
- 代理机构： Edell, Shapiro & Finnan, LLC
- 优先权： KR10-2008-0071414 20080723
- 主分类号： G01N23/00
- IPC分类号： G01N23/00
摘要：
An apparatus and method for measuring the crystallographic orientation relationship of neighboring grains and the characteristics of grain boundaries using a goniometer of a transmission electron microscope are disclosed to check the orientation relationship between two crystals and the characteristics of grain boundaries with a small error in real time. An apparatus for measuring the orientation relationship between neighboring grains and the characteristics of grain boundaries by using a goniometer of a transmission electron stereoscope, the apparatus comprising a goniometer mounted at a transmission electron microscope and a measurement unit for revealing the characteristics of grain boundaries of a specimen by linear-algebraically interpreting the relationship between crystal axes and tilt axes of the specimen using the goniometer.
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