Invention Grant
US08014201B2 Nonvolatile memory device extracting parameters and nonvolatile memory system including the same
有权
非易失性存储器件提取参数和非易失性存储器系统包括相同的
- Patent Title: Nonvolatile memory device extracting parameters and nonvolatile memory system including the same
- Patent Title (中): 非易失性存储器件提取参数和非易失性存储器系统包括相同的
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Application No.: US12458398Application Date: 2009-07-10
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Publication No.: US08014201B2Publication Date: 2011-09-06
- Inventor: Ki-Tae Park
- Applicant: Ki-Tae Park
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2008-0074746 20080730
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
The nonvolatile memory device includes a memory cell array having a plurality of memory blocks and a control logic circuit configured to store a parameter to access at least one of the plurality of memory blocks, configured to detect a variation of the parameter while accessing the at least one the memory block, and configured to store the varied parameter into the memory cell array in accordance with a result of the detection, wherein the control logic circuit is configured to utilize the varied parameter, which is stored in the memory cell array, while accessing the at least one memory block.
Public/Granted literature
- US20100027337A1 Nonvolatile memory device extracting parameters and nonvolatile memory system including the same Public/Granted day:2010-02-04
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