发明授权
- 专利标题： Method and system for scatter correction
- 专利标题（中）： 散射校正的方法和系统
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申请号： US12270437申请日： 2008-11-13
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公开(公告)号： US08017914B2公开(公告)日： 2011-09-13
- 发明人: Scott David Wollenweber , David Leo McDaniel , Charles William Stearns
- 申请人： Scott David Wollenweber , David Leo McDaniel , Charles William Stearns
- 申请人地址： US NY Schenectady
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： US NY Schenectady
- 代理机构： The Small Patent Law Group
- 代理商 Dean Small
- 主分类号： G01T1/166
- IPC分类号： G01T1/166
摘要：
A method and apparatus are provided for correcting primary and secondary emission data. The method includes obtaining an emission data set having primary and secondary emission data representative of primary and secondary emission particles emitting from a region of interest and applying a scatter correction model to the emission data set to derive an estimated scatter vector. The method also includes comparing the emission data set to the estimated scatter vector to identify an amount of secondary emission data in the emission data set and correcting the emission data set based on the amount of secondary emission data identified in the comparing operation.
公开/授权文献
- US20100116994A1 METHOD AND SYSTEM FOR SCATTER CORRECTION 公开/授权日：2010-05-13