发明授权
- 专利标题: Global statistical optimization, characterization, and design
- 专利标题(中): 全局统计优化,表征和设计
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申请号: US12396972申请日: 2009-03-03
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公开(公告)号: US08024682B2公开(公告)日: 2011-09-20
- 发明人: Trent Lorne McConaghy , Pat Drennan , Joel Cooper , Jeffrey Dyck , David Callele , Shawn Rusaw , Samer Sallam , Jiangdon Ge , Anthony Arkles , Kristopher Breen , Sean Cocks
- 申请人: Trent Lorne McConaghy , Pat Drennan , Joel Cooper , Jeffrey Dyck , David Callele , Shawn Rusaw , Samer Sallam , Jiangdon Ge , Anthony Arkles , Kristopher Breen , Sean Cocks
- 申请人地址: CA Saskatoon
- 专利权人: Solido Design Automation Inc.
- 当前专利权人: Solido Design Automation Inc.
- 当前专利权人地址: CA Saskatoon
- 代理商 Dennis R. Haszko
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
For application to analog, mixed-signal, and custom digital circuits, a system and method to do: global statistical optimization (GSO), global statistical characterization (GSC), global statistical design (GSD), and block-specific design. GSO can perform global yield optimization on hundreds of variables, with no simplifying assumptions. GSC can capture and display mappings from design variables to performance, across the whole design space. GSC can handle hundreds of design variables in a reasonable time frame, e.g., in less than a day, for a reasonable number of simulations, e.g., less than 100,000. GSC can capture design variable interactions and other possible nonlinearities, explicitly capture uncertainties, and intuitively display them. GSD can support the user's exploration of design-to-performance mappings with fast feedback, thoroughly capturing design variable interactions in the whole space, and allow for more efficiently created, more optimal designs. Block-specific design should make it simple to design small circuit blocks, in less time and with lower overhead than optimization through optimization.
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