发明授权
US08031421B2 Method for measuring optimum seeking time and inspection apparatus using the same
有权
测量最佳寻道时间的方法及使用该方法的检查装置
- 专利标题: Method for measuring optimum seeking time and inspection apparatus using the same
- 专利标题(中): 测量最佳寻道时间的方法及使用该方法的检查装置
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申请号: US12788481申请日: 2010-05-27
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公开(公告)号: US08031421B2公开(公告)日: 2011-10-04
- 发明人: Kenichi Shitara , Sumihiro Maeda
- 申请人: Kenichi Shitara , Sumihiro Maeda
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Brundidge & Stanger, P.C.
- 优先权: JP2009-128633 20090528
- 主分类号: G11B27/36
- IPC分类号: G11B27/36
摘要:
The present invention provides a method for measuring an optimum seeking time and an inspection apparatus using this method capable of measuring and setting an optimum seeking time for inspection of a magnetic disk or magnetic head. The method samples average level differences of sector-wise read signals in positive and negative domains for one round of track and detects a minimum value H and a minimum value L among these differences. The method recalculates the seeking time while changing the settling time. After writing and reading test data, calculates a deviation DEV of average levels DEV=(H−L)/(H+L). The method is adapted to obtain a minimum one of the values of settling time having measured when the deviation DEV of average levels is equal to or less than a predetermined value as an optimum settling time or an optimum seeking time.