Invention Grant
- Patent Title: Resistive random access memory device
- Patent Title (中): 电阻随机存取存储器件
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Application No.: US12007013Application Date: 2008-01-04
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Publication No.: US08035095B2Publication Date: 2011-10-11
- Inventor: Jung-hyun Lee , Myoung-jae Lee
- Applicant: Jung-hyun Lee , Myoung-jae Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2007-0085558 20070824
- Main IPC: H01L45/00
- IPC: H01L45/00

Abstract:
Provided is a resistive random access memory device that includes a storage node connected to a switching device. The resistive random access memory device includes a first electrode, a resistance variable layer, and a second electrode which are sequentially stacked, wherein a diffusion blocking layer is formed between the first electrode and the resistance variable layer or between the resistance variable layer or/and the second electrode.
Public/Granted literature
- US20090052226A1 Resistive random access memory device Public/Granted day:2009-02-26
Information query
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