Invention Grant
US08039802B2 Apparatus for generating/detecting THz wave and method of manufacturing the same
有权
用于产生/检测太赫兹波的装置及其制造方法
- Patent Title: Apparatus for generating/detecting THz wave and method of manufacturing the same
- Patent Title (中): 用于产生/检测太赫兹波的装置及其制造方法
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Application No.: US12764361Application Date: 2010-04-21
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Publication No.: US08039802B2Publication Date: 2011-10-18
- Inventor: Jaeheon Shin , Kyung Hyun Park , Namje Kim , Sang-Pil Han , Chul-Wook Lee , Eundeok Sim , Yongsoon Baek
- Applicant: Jaeheon Shin , Kyung Hyun Park , Namje Kim , Sang-Pil Han , Chul-Wook Lee , Eundeok Sim , Yongsoon Baek
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2009-0088664 20090918
- Main IPC: G01J5/02
- IPC: G01J5/02
Abstract:
Provided are an apparatus for generating/detecting terahertz wave and a method of manufacturing the same. The apparatus includes a substrate, a photo conductive layer, a first electrode and a second electrode, and a lens. The photo conductive layer is formed on an entire surface of the substrate. The first electrode and a second electrode formed on the photo conductive layer. The first and second electrodes are spaced from each other by a certain gap. The lens is formed on the first and second electrodes. The lens is filled in the gap between the first and second electrodes.
Public/Granted literature
- US20110068270A1 APPARATUS FOR GENERATING/DETECTING THZ WAVE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2011-03-24
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