发明授权
- 专利标题: Measurement method of chromatic dispersion of optical beam waveguide using interference fringe measurement system
- 专利标题(中): 使用干涉条纹测量系统的光束波导的色散测量方法
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申请号: US12511803申请日: 2009-07-29
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公开(公告)号: US08040523B2公开(公告)日: 2011-10-18
- 发明人: Kyong Hon Kim , Seunghwan Kim , Seounghun Lee , Elhang Lee
- 申请人: Kyong Hon Kim , Seunghwan Kim , Seounghun Lee , Elhang Lee
- 申请人地址: KR Incheon
- 专利权人: INHA-Industry Partnership Institute
- 当前专利权人: INHA-Industry Partnership Institute
- 当前专利权人地址: KR Incheon
- 代理机构: Drinker Biddle & Reath LLP
- 优先权: KR10-2008-0120439 20081201
- 主分类号: G01B9/02
- IPC分类号: G01B9/02 ; G01J3/45 ; G01N21/00
摘要:
The present invention relates to a measurement method of the chromatic dispersion of an optical waveguide using an optical interferometer with a broadband multi-wavelength light source and an optical spectrum analyzing apparatus, wherein one arm, called “reference arm” of the interferometer's two arms has an adjustable air spacing and the other arm, called “sample arm” can contain said optical waveguide to be measured, and including the following measurement and analysis steps: measuring interference spectra of the optical beam output exiting from the said interferometer with an optical spectrum analyzing apparatus when said optical waveguide is connected to said sample arm, and when said optical waveguide is not connected to said sample arm respectively; by adjusting the reference arm length for appearance of clear interference patterns; converting the wavelength-domain interference spectra into frequency-domain interference spectra and calculating phase difference values of the interference peaks of one of the spectra from a predetermined reference peak as a function of the frequency change by counting the interference peak (or valley) points; finding a Taylor series curve fit function for each set of the phase difference value data corresponding to each of the two interference spectra; and calculating a chromatic dispersion coefficient of the optical waveguide by using the coefficients of the Taylor series curve fit functions.
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