Invention Grant
- Patent Title: Burn-in test apparatus
- Patent Title (中): 老化测试仪器
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Application No.: US12004786Application Date: 2007-12-20
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Publication No.: US08041531B2Publication Date: 2011-10-18
- Inventor: Sang Kwon Lee , Bong Seok Han
- Applicant: Sang Kwon Lee , Bong Seok Han
- Applicant Address: KR Icheon-si
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Cooper & Dunham LLP
- Agent John P. White
- Priority: KR10-2007-0049357 20070521
- Main IPC: G11C29/08
- IPC: G11C29/08
Abstract:
A burn-in test apparatus and a semiconductor device using the same are disclosed. The burn-in test apparatus includes a flag signal generating unit configured to receive an external input signal and an external address externally inputted for a burn-in test and generate a flag signal, and a burn-in test unit configured to receive the flag signal, generate a toggled output enable signal, and drive an input/output line to toggle a signal on the input/output line.
Public/Granted literature
- US20080291761A1 Burn-in test apparatus Public/Granted day:2008-11-27
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