发明授权
US08042012B2 Systems and devices including memory with built-in self test and methods of making and using the same
有权
系统和设备，包括具有内置自检功能的内存，以及使用它们的方法
- 专利标题： Systems and devices including memory with built-in self test and methods of making and using the same
- 专利标题（中）： 系统和设备，包括具有内置自检功能的内存，以及使用它们的方法
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申请号： US12903936申请日： 2010-10-13
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公开(公告)号： US08042012B2公开(公告)日： 2011-10-18
- 发明人: R. Jacob Baker
- 申请人： R. Jacob Baker
- 申请人地址： US ID Bosie
- 专利权人： Micron Technology, Inc.
- 当前专利权人： Micron Technology, Inc.
- 当前专利权人地址： US ID Bosie
- 代理机构： Fletcher Yoder
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
Disclosed are methods, systems and devices, such as a device including a data location, a quantizing circuit coupled to the data location, and a test module coupled to the quantizing circuit. The quantizing circuit may include an analog-to-digital converter, a switch coupled to the memory element and a feedback signal path coupled to the output of the analog-to-digital converter and to the switch.
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