发明授权
- 专利标题: Wipe sampling assembly
- 专利标题(中): 擦拭取样组件
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申请号: US12341275申请日: 2008-12-22
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公开(公告)号: US08042414B2公开(公告)日: 2011-10-25
- 发明人: Hua Peng , Jianhua Liu , Yangtian Zhang , Zhongxia Zhang , Wei Chen
- 申请人: Hua Peng , Jianhua Liu , Yangtian Zhang , Zhongxia Zhang , Wei Chen
- 申请人地址: CN Beijing
- 专利权人: Nuctech Company Limited
- 当前专利权人: Nuctech Company Limited
- 当前专利权人地址: CN Beijing
- 代理机构: Westman, Champlin & Kelly, P.A.
- 优先权: CN200710308542 20071229
- 主分类号: G01N1/04
- IPC分类号: G01N1/04
摘要:
A wipe sampling assembly used for an ion mobility spectrometer is disclosed. The wipe sampling assembly comprises three layers in which the upper layer and the lower layer are protective paper sheets, while the middle layer is a sampling swab. The swab will not be contaminated when not in use as it is covered by the two protective paper sheets. The hand can only contact the protective paper and will not contact the swab while sampling to prevent the swab from being contaminated. The above wipe sampling assembly is used with no need for any additional device, thus making it easy to operate and carry.
公开/授权文献
- US20090165577A1 WIPE SAMPLING ASSEMBLY 公开/授权日:2009-07-02
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