Invention Grant
- Patent Title: TAP sampling at double rate
- Patent Title (中): TAP采样率为双倍
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Application No.: US12657642Application Date: 2010-01-25
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Publication No.: US08046647B2Publication Date: 2011-10-25
- Inventor: Robert Warren
- Applicant: Robert Warren
- Applicant Address: GB Bristol
- Assignee: STMicroelectronics Limited
- Current Assignee: STMicroelectronics Limited
- Current Assignee Address: GB Bristol
- Priority: EP03257953 20031217
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G11C29/00 ; G01R31/26
Abstract:
An integrated circuit comprising: at least one test input for receiving test data; test control circuitry between the at least one test input and circuitry to be tested; wherein the test data is clocked in on a rising clock edge and a falling clock edge.
Public/Granted literature
- US20100138706A1 TAP sampling at double rate Public/Granted day:2010-06-03
Information query
