发明授权
- 专利标题: Plasma deposition of amorphous semiconductors at microwave frequencies
- 专利标题(中): 微波等离子体沉积非晶半导体
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申请号: US12855631申请日: 2010-08-12
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公开(公告)号: US08048782B1公开(公告)日: 2011-11-01
- 发明人: Stanford R. Ovshinsky , David Strand , Patrick Klersy , Boil Pashmakov
- 申请人: Stanford R. Ovshinsky , David Strand , Patrick Klersy , Boil Pashmakov
- 申请人地址: US MI Bloomfield Hills
- 专利权人: Ovshinsky Innovation LLC
- 当前专利权人: Ovshinsky Innovation LLC
- 当前专利权人地址: US MI Bloomfield Hills
- 代理商 Kevin L. Bray
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
Apparatus and method for plasma deposition of thin film photovoltaic materials at microwave frequencies. The apparatus avoids deposition on windows or other microwave transmission elements that couple microwave energy to deposition species. The apparatus includes a microwave applicator with conduits passing therethrough that carry deposition species. The applicator transfers microwave energy to the deposition species to transform them to a reactive state conducive to formation of a thin film material. The conduits physically isolate deposition species that would react to form a thin film material at the point of microwave power transfer. The deposition species are separately energized and swept away from the point of power transfer to prevent thin film deposition. The invention allows for the ultrafast formation of silicon-containing amorphous semiconductors that exhibit high mobility, low porosity, little or no Staebler-Wronski degradation, and low defect concentration.
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