发明授权
US08049964B2 Optical element with an antireflection coating, projection objective, and exposure apparatus comprising such an element
有权
具有抗反射涂层的光学元件,投影物镜和包括这种元件的曝光设备
- 专利标题: Optical element with an antireflection coating, projection objective, and exposure apparatus comprising such an element
- 专利标题(中): 具有抗反射涂层的光学元件,投影物镜和包括这种元件的曝光设备
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申请号: US11917500申请日: 2006-06-13
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公开(公告)号: US08049964B2公开(公告)日: 2011-11-01
- 发明人: Christoph Zaczek , Alexandra Pazidis
- 申请人: Christoph Zaczek , Alexandra Pazidis
- 申请人地址: DE Oberkocken
- 专利权人: Carl Zeiss SMT GmbH
- 当前专利权人: Carl Zeiss SMT GmbH
- 当前专利权人地址: DE Oberkocken
- 代理机构: Sughrue Mion, PLLC
- 国际申请: PCT/EP2006/005630 WO 20060613
- 国际公布: WO2006/133884 WO 20061221
- 主分类号: G02B1/10
- IPC分类号: G02B1/10 ; G02B5/08 ; G02B5/20 ; F21V9/04 ; F21V9/06 ; G03B27/42
摘要:
An optical element (14) transparent for radiation with a wavelength λ in the ultraviolet wavelength range below 250 nm, in particular at 193 nm, comprises a substrate (17) with a refractive index nS larger than 1.6, and an antireflection coating (16) formed on at least part of the surface of the substrate (17) between the substrate (17) and an ambient medium with a refractive index nA, preferably with nA=1.0. The antireflection coating (16) consists of a single layer of a material with a refractive index nL of about nL=√{square root over (nAnS)}, in particular nL>1.3, and the optical thickness dL of the single layer is about λ/4. The optical element (14) is preferably part of a projection objective (5) in a microlithography projection exposure apparatus (1) and located adjacent to a light-sensitive substrate (10).
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