发明授权
- 专利标题: Microwave-based examination using hypothesis testing
- 专利标题(中): 基于微波检验的假设检验
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申请号: US10942115申请日: 2004-09-15
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公开(公告)号: US08050740B2公开(公告)日: 2011-11-01
- 发明人: Shakti K. Davis , Susan C. Hagness , Barry D. Van Veen
- 申请人: Shakti K. Davis , Susan C. Hagness , Barry D. Van Veen
- 申请人地址: US WI Madison
- 专利权人: Wisconsin Alumni Research Foundation
- 当前专利权人: Wisconsin Alumni Research Foundation
- 当前专利权人地址: US WI Madison
- 代理机构: Bell & Manning, LLC
- 主分类号: A61B5/00
- IPC分类号: A61B5/00
摘要:
Microwave examination of individuals is carried out by transmitting microwave signals from multiple antenna locations into an individual and receiving the backscattered microwave signals at multiple antenna locations to provide received signals from the antennas. The received signals are processed to remove the skin interface reflection component of the signal and the corrected signal data are provided to a hypothesis testing process. In hypothesis testing for detecting tumors, image data are formed from the test statistic used to perform a binary hypothesis test at each voxel. The null hypothesis asserts that no tumor is present at a candidate voxel location. The voxel threshold is determined by specifying a false discovery rate to control the expected proportion of false positives in the image. When the test statistic value associated with a voxel is greater than the threshold, the null hypothesis is rejected and the test statistic is assigned to the voxel. For voxels where the test statistic falls below the threshold, the null hypothesis is accepted and the voxel value is set to zero. The resulting image indicates the locations or other characteristics of detected tumors.
公开/授权文献
- US20060058606A1 Microwave-based examination using hypothesis testing 公开/授权日:2006-03-16
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